• 专利标题: ELECTROSTATIC PROTECTION CIRCUIT AND SEMICONDUCTOR DEVICE
  • 申请号: US18466492
    申请日: 2023-09-13
  • 公开(公告)号: US20240006408A1
    公开(公告)日: 2024-01-04
  • 发明人: TSUTOMU TOMIOKA
  • 申请人: ABLIC Inc.
  • 申请人地址: JP Nagano
  • 专利权人: ABLIC Inc.
  • 当前专利权人: ABLIC Inc.
  • 当前专利权人地址: JP Nagano
  • 优先权: JP 19233133 2019.12.24
  • 分案原申请号: US17112070 2020.12.04
  • 主分类号: H01L27/02
  • IPC分类号: H01L27/02 H02H9/04
ELECTROSTATIC PROTECTION CIRCUIT AND SEMICONDUCTOR DEVICE
摘要:
An electrostatic protection circuit and a semiconductor device include: a first diode whose anode is connected to a signal terminal; a second diode whose cathode is connected to a cathode of the first diode and whose anode is connected to a GND terminal; and a depletion type MOS transistor connected in parallel with the first diode.
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