- 专利标题: OPTIMIZED SEASONING TRIM VALUES BASED ON FORM FACTORS IN MEMORY SUB-SYSTEM MANUFACTURING
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申请号: US17961193申请日: 2022-10-06
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公开(公告)号: US20230062213A1公开(公告)日: 2023-03-02
- 发明人: Tingjun Xie , Murong Lang , Zhenming Zhou
- 申请人: Micron Technology, Inc.
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 主分类号: G11C29/10
- IPC分类号: G11C29/10
摘要:
A system and method for optimizing seasoning trim values based on form factors in memory sub-system manufacturing. An example method includes selecting a baseline set of trim values based on a set of memory sub-system form factors; generating a first modified set of trim values for seasoning operations by modifying a first trim value of the baseline trim values; causing each memory sub-system of a plurality of memory sub-systems to perform seasoning operations using the first modified set of trim values; responsive to determining that a memory sub-system of the plurality of memory sub-system failed to satisfy a predetermined criterion, determining whether the memory sub-system is extrinsically defective; responsive to determining that the memory sub-system is extrinsically defective, removing the extrinsically defective memory sub-system from the set of memory sub-systems; and generating a second modified set of trim values for seasoning operations.
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