Invention Publication
- Patent Title: TEMPERATURE-DEPENDENT WORD LINE VOLTAGE AND DISCHARGE RATE FOR REFRESH READ OF NON-VOLATILE MEMORY
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Application No.: US17752524Application Date: 2022-05-24
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Publication No.: US20230410901A1Publication Date: 2023-12-21
- Inventor: Dong-Il Moon , Abhijith Prakash , Wei Zhao , Henry Chin
- Applicant: SanDisk Technologies LLC
- Applicant Address: US TX Addison
- Assignee: SanDisk Technologies LLC
- Current Assignee: SanDisk Technologies LLC
- Current Assignee Address: US TX Addison
- Main IPC: G11C11/56
- IPC: G11C11/56 ; G11C16/26

Abstract:
A memory apparatus and method of operation are provided. The apparatus includes memory cells each connected to one of a plurality of word lines. The memory cells are disposed in strings and configured to retain a threshold voltage corresponding to one of a plurality of data states. A control means is coupled to the plurality of word lines and the strings and is configured to apply a read voltage to a selected ones of the plurality of word lines during a read operation and ramp down to a discharge voltage at an end of the read operation and apply a ready voltage to the selected ones of the plurality of word lines during a ready period of time following the read operation. The control means is also configured to adjust at least one of the discharge voltage and the ready voltage based on a temperature of the memory apparatus.
Public/Granted literature
- US11894051B2 Temperature-dependent word line voltage and discharge rate for refresh read of non-volatile memory Public/Granted day:2024-02-06
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