发明公开
- 专利标题: CAPACITOR MEASUREMENT
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申请号: US18335511申请日: 2023-06-15
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公开(公告)号: US20230324475A1公开(公告)日: 2023-10-12
- 发明人: Davide Argento , Orazio Pennisi , Stefano Castorina , Vanni Poletto , Matteo Landini , Andrea Maino
- 申请人: STMicroelectronics S.r.l.
- 申请人地址: IT Agrate Brianza (MB)
- 专利权人: STMicroelectronics S.r.l.
- 当前专利权人: STMicroelectronics S.r.l.
- 当前专利权人地址: IT Agrate Brianza (MB)
- 分案原申请号: US17407747 2021.08.20
- 主分类号: G01R31/64
- IPC分类号: G01R31/64 ; G01R27/26 ; G01R31/00
摘要:
A system and method for measuring a capacitance value of a capacitor are provided. In embodiments, a resistor is coupled to a terminal of the capacitor. A difference in voltage at the terminal between a first time and a second time during a discharge routine of the capacitor is measured. The discharge routine includes sinking a current through a discharge circuit coupled to the resistor from first to second. Integration of a difference in voltage at terminals of the resistor during the discharge routine between the first and second times is also measured. The capacitance value is computed based on the measured difference in voltage, the measured integration, and the resistance value of the resistor. The health of the capacitor is determined based on a difference between the computed capacitance value and a threshold value.
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