- 专利标题: DISCHARGE CIRCUITS FOR ERASING NAND FLASH MEMORY
-
申请号: US17847657申请日: 2022-06-23
-
公开(公告)号: US20230268008A1公开(公告)日: 2023-08-24
- 发明人: Weiwei HE , Liang QIAO , Mingxian LEI
- 申请人: Yangtze Memory Technologies Co., Ltd.
- 申请人地址: CN Wuhan
- 专利权人: Yangtze Memory Technologies Co., Ltd.
- 当前专利权人: Yangtze Memory Technologies Co., Ltd.
- 当前专利权人地址: CN Wuhan
- 主分类号: G11C16/16
- IPC分类号: G11C16/16 ; G11C16/26 ; G11C16/04 ; G11C7/08 ; H03K19/017
摘要:
The present disclosure provides a method for discharging a memory device after an erase operation. The method comprises grounding a source line of the memory device; and switching on a discharge transistor to connect a bit line of the memory device to the source line by maintaining a constant voltage difference between a gate terminal of the discharge transistor and the source line. The method also includes comparing an electrical potential of the source line with a first predetermined value; and floating the gate terminal of the discharge transistor when the electrical potential of the source line is lower than the first predetermined value.
公开/授权文献
- US12020752B2 Discharge circuits for erasing NAND flash memory 公开/授权日:2024-06-25
信息查询