- 专利标题: SEMICONDUCTOR DEVICE
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申请号: US17770360申请日: 2020-10-20
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公开(公告)号: US20220384433A1公开(公告)日: 2022-12-01
- 发明人: Takahiko ISHIZU , Takayuki IKEDA , Atsushi MIYAGUCHI , Shunpei YAMAZAKI
- 申请人: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- 申请人地址: JP ATSUGI-SHI, KANAGAWA-KEN
- 专利权人: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- 当前专利权人: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- 当前专利权人地址: JP ATSUGI-SHI, KANAGAWA-KEN
- 优先权: JP2019-199663 20191101
- 国际申请: PCT/IB2020/059829 WO 20201020
- 主分类号: H01L27/092
- IPC分类号: H01L27/092 ; H01L29/786 ; H01L21/02 ; H01L21/8258 ; H01L29/66
摘要:
A semiconductor device having a novel structure is provided. The semiconductor device includes a p-channel transistor and an n-channel transistor provided over a silicon substrate. One of a source and a drain of the p-channel transistor is electrically connected to a first power supply line, one of a source and a drain of the n-channel transistor is electrically connected to a second power supply line, and the other of the source and the drain of the p-channel transistor is connected to the other of the source and the drain of the n-channel transistor. The p-channel transistor includes a first gate electrode and a first back gate electrode provided to face the first gate electrode with a first channel formation region therebetween. The first back gate electrode is formed using a region where an impurity element imparting conductivity is selectively introduced to the silicon substrate. The n-channel transistor is provided above a layer including the p-channel transistor.
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