Invention Application
- Patent Title: Semiconductor Device and Method of Forming Thereof
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Application No.: US17205847Application Date: 2021-03-18
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Publication No.: US20220301858A1Publication Date: 2022-09-22
- Inventor: Cheng-Wei Chang , Min-Hsiu Hung , Chun-I Tsai , Ken-Yu Chang , Yi-Ying Liu
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Main IPC: H01L21/02
- IPC: H01L21/02 ; H01L21/768

Abstract:
A method of forming a semiconductor device includes forming a first conductive feature on a bottom surface of an opening through a dielectric layer. The forming the first conductive feature leaves seeds on sidewalls of the opening. A treatment process is performed on the seeds to form treated seeds. The treated seeds are removed with a cleaning process. The cleaning process may include a rinse with deionized water. A second conductive feature is formed to fill the opening.
Public/Granted literature
- US11670499B2 Method of forming conductive feature including cleaning step Public/Granted day:2023-06-06
Information query
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