- 专利标题: FINFET MOS CAPACITOR
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申请号: US17159289申请日: 2021-01-27
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公开(公告)号: US20220238729A1公开(公告)日: 2022-07-28
- 发明人: Sung-Hsin Yang , Jung-Chi Jeng , Ru-Shang Hsiao
- 申请人: Taiwan Semiconductor Manufacturing Co., Ltd.
- 申请人地址: TW Hsin-Chu
- 专利权人: Taiwan Semiconductor Manufacturing Co., Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Co., Ltd.
- 当前专利权人地址: TW Hsin-Chu
- 主分类号: H01L29/94
- IPC分类号: H01L29/94 ; H01L27/06 ; H01L29/78 ; H01L29/66
摘要:
Various embodiments of the present disclosure are directed towards a FinFET MOS capacitor. In some embodiments, the FinFET MOS capacitor comprises a substrate and a capacitor fin structure extending upwardly from an upper surface of the substrate. The capacitor fin structure comprises a pair of dummy source/drain regions separated by a dummy channel region and a capacitor gate structure straddling on the capacitor fin structure. The capacitor gate structure is separated from the capacitor fin structure by a capacitor gate dielectric.
公开/授权文献
- US11469335B2 FinFET MOS capacitor 公开/授权日:2022-10-11
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