- 专利标题: Haptic Feedback Microscope
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申请号: US17396740申请日: 2021-08-08
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公开(公告)号: US20220236227A1公开(公告)日: 2022-07-28
- 发明人: Dan Slater
- 申请人: Dan Slater
- 申请人地址: US CA La Habra Heights
- 专利权人: Dan Slater
- 当前专利权人: Dan Slater
- 当前专利权人地址: US CA La Habra Heights
- 主分类号: G01N29/06
- IPC分类号: G01N29/06 ; G10K11/30 ; G01H3/12 ; G01N29/22 ; G01N29/24
摘要:
A system and method for using a microscope to at least haptically observe a specimen in a fluid is provided. In one embodiment of the present invention, an audio frequency modulation sensing (AFMS) device is used to convert an optical signal from the specimen into an electrical signal. A haptic feedback device is then used to convert the electrical signal in at least vibrations, thereby providing a user with haptic feedback associated with the optical signal from the specimen. In another embodiment, a second electrical signal can be provided to a second haptic feedback (e.g., shaker, piezo electric, electric current inducing, etc.) device in the fluid, thereby allowing for bidirectional haptic feedback between the user and the specimen. In other embodiments, aural data can be extracted from the electrical signal and presented to the user either alone in in synchronization with video data (e.g., from a video camera).
公开/授权文献
- US11668917B2 Haptic feedback microscope 公开/授权日:2023-06-06
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