Invention Application
- Patent Title: METHOD AND APPARATUS FOR OBTAINING TRANSMITTER TEST PARAMETER, AND STORAGE MEDIUM
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Application No.: US17682836Application Date: 2022-02-28
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Publication No.: US20220182139A1Publication Date: 2022-06-09
- Inventor: Kuo ZHANG , Lei ZHOU , Borui LI , Shengping LI
- Applicant: Huawei Technologies Co., Ltd.
- Applicant Address: CN Shenzhen
- Assignee: Huawei Technologies Co., Ltd.
- Current Assignee: Huawei Technologies Co., Ltd.
- Current Assignee Address: CN Shenzhen
- Priority: CN201910819211.0 20190831
- Main IPC: H04B10/079
- IPC: H04B10/079
Abstract:
Embodiments of this application disclose a method and an apparatus for obtaining a transmitter test parameter, and a storage medium, to obtain a noise amount corresponding to a level amplitude of a sampled electrical signal, without limiting a type of a receiver that performs a consistency test on a transmitter by using a transmitter test parameter.
Public/Granted literature
- US11962344B2 Method and apparatus for obtaining transmitter test parameter, and storage medium Public/Granted day:2024-04-16
Information query
