- 专利标题： Test Codes for Secure Test Mode on Math Assistance Devices
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申请号： US17458544申请日： 2021-08-27
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公开(公告)号： US20220164307A1公开(公告)日： 2022-05-26
- 发明人: Trevor Thomas Chapman , Stephen B Loe , Malgorzata Anna Brothers , Matt Thomas Nicolosi , Michael Georges Stella
- 申请人： Texas Instruments Incorporated
- 申请人地址： US TX Dallas
- 专利权人： Texas Instruments Incorporated
- 当前专利权人： Texas Instruments Incorporated
- 当前专利权人地址： US TX Dallas
- 主分类号： G06F15/02
- IPC分类号： G06F15/02 ; G09B19/02
摘要：
A method for test configuration on a first math assistance device is provided that includes receiving a test code by the first math assistance device, wherein the test code includes one or more functionality restrictions, and entering secure test mode on the first math assistance device with the one or more functionality restrictions.
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