- 专利标题: ETCHING METAL-OXIDE AND PROTECTING CHAMBER COMPONENTS
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申请号: US17278191申请日: 2019-09-20
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公开(公告)号: US20210308726A1公开(公告)日: 2021-10-07
- 发明人: Akhil N. Singhal , Dustin Zachary Austin , Alon Ganany , Daniel Boatright
- 申请人: Lam Research Corporation
- 申请人地址: US CA Fremont
- 专利权人: Lam Research Corporation
- 当前专利权人: Lam Research Corporation
- 当前专利权人地址: US CA Fremont
- 国际申请: PCT/US2019/052208 WO 20190920
- 主分类号: B08B9/08
- IPC分类号: B08B9/08 ; B08B5/00 ; B08B3/08 ; C23C16/44
摘要:
Various embodiments include methods and chemistries to etch metal-oxide films. In one embodiment, a method of etching tin oxide (SnO2) films includes using thionyl chloride (SOCl2) chemistry to produce an etch rate of the SnO2 films of up to 10-times higher as compared with Cl2 chemistry for similar flow-rates and process conditions, and gettering oxygen species from the SnO2 films by using the SOCl2, thereby forming volatile SO2 and volatile SnCl4 to provide human safety and machine safety and operations. Other methods, chemistries, and techniques are disclosed.
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