Invention Application
- Patent Title: Methods of Incorporating Leaker-Devices into Capacitor Configurations to Reduce Cell Disturb, and Capacitor Configurations Incorporating Leaker-Devices
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Application No.: US17131065Application Date: 2020-12-22
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Publication No.: US20210134816A1Publication Date: 2021-05-06
- Inventor: Alessandro Calderoni , Beth R. Cook , Durai Vishak Nirmal Ramaswamy , Ashonita A. Chavan
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Main IPC: H01L27/11509
- IPC: H01L27/11509 ; H01G4/008 ; H01G4/06 ; H01G4/40 ; H01L49/02 ; H01L27/11504 ; G11C11/22 ; H01L27/11507

Abstract:
Some embodiments include an integrated assembly having first electrodes with top surfaces, and with sidewall surfaces extending downwardly from the top surfaces. The first electrodes are solid pillars. Insulative material is along the sidewall surfaces of the first electrodes. Second electrodes extend along the sidewall surfaces of the first electrodes and are spaced from the sidewall surfaces by the insulative material. Conductive-plate-material extends across the first and second electrodes, and couples the second electrodes to one another. Leaker-devices electrically couple the first electrodes to the conductive-plate-material and are configured to discharge at least a portion of excess charge from the first electrodes to the conductive-plate-material. Some embodiments include methods of forming integrated assemblies.
Public/Granted literature
Information query
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