- 专利标题: NITROGEN CONTAINING SINGLE CRYSTAL DIAMOND MATERIALS OPTIMIZED FOR MAGNETOMETRY APPLICATIONS
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申请号: US16065526申请日: 2016-12-06
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公开(公告)号: US20210054526A1公开(公告)日: 2021-02-25
- 发明人: Wilbur LEW , Gregory BRUCE , Andrew Mark EDMONDS , Matthew Lee MARKHAM , Alastair Douglas STACEY , Harpreet Kaur DHILLON
- 申请人: ELEMENT SIX TECHNOLOGIES LIMITED , ELEMENT SIX TECHNOLOGIES US CORPORATION
- 申请人地址: GB DIDCOT, OXFORDHIRE; US CA SANTA CLARA
- 专利权人: ELEMENT SIX TECHNOLOGIES LIMITED,ELEMENT SIX TECHNOLOGIES US CORPORATION
- 当前专利权人: ELEMENT SIX TECHNOLOGIES LIMITED,ELEMENT SIX TECHNOLOGIES US CORPORATION
- 当前专利权人地址: GB DIDCOT, OXFORDHIRE; US CA SANTA CLARA
- 优先权: GB1522650.9 20151222
- 国际申请: PCT/US2016/065091 WO 20161206
- 主分类号: C30B29/04
- IPC分类号: C30B29/04 ; C30B25/02 ; C30B33/04
摘要:
A single crystal diamond material comprising: neutral nitrogen-vacancy defects (NV0); negatively charged nitrogen-vacancy defects (NV−); and single substitutional nitrogen defects (Ns) which transfer their charge to the neutral nitrogen-vacancy defects (NV0) to convert them into the negatively charged nitrogen-vacancy defects (NV), characterized in that the single crystal diamond material has a magnetometry figure of merit (FOM) of at least 2, wherein the magnetometry figure of merit is defined by (I) where R is a ratio of concentrations of negatively charged nitrogen-vacancy defects to neutral nitrogen-vacancy defects ([NV−]/[NV0]), [NV−] is the concentration of negatively charged nitrogen-vacancy defects measured in parts-per-million (ppm) atoms of the single crystal diamond material, [NV0] is a concentration of neutral nitrogen-vacancy defects measured in parts-per-million (ppm) atoms of the single crystal diamond material, and T2′ is a decoherence time of the NV− defects, where T2′ is T2* for DC magnetometry or T2 for AC magnetometry.
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