- 专利标题: Method for Quantitatively Analyzing Residual Cl in Zinc Ferrite
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申请号: US16605704申请日: 2018-07-16
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公开(公告)号: US20200333303A1公开(公告)日: 2020-10-22
- 发明人: Sangwoo Kim , Hyun Kyung Yoon , Sumin Na , Jieun Kim , Hyun Woo Nho
- 申请人: LG Chem, Ltd.
- 申请人地址: KR Seoul
- 专利权人: LG Chem, Ltd.
- 当前专利权人: LG Chem, Ltd.
- 当前专利权人地址: KR Seoul
- 优先权: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@785ae8d4
- 国际申请: PCT/KR2018/008011 WO 20180716
- 主分类号: G01N30/96
- IPC分类号: G01N30/96 ; G01N30/14 ; G01N31/12
摘要:
The present invention relates to a method for quantitatively analyzing Cl, remaining after synthesis, in zinc ferrite synthesized using chloride precursors such as zinc chloride and iron chloride, and provides a method capable of using, in a quantitative analysis method of Cl remaining after synthesis of an inorganic material, AQF-IC, which has been used only in the quantitative analysis of an organic sample since gaseous Cl, discharged after burning zinc ferrite in an automatic quick furnace (AQF) by using an Sn capsule and tungsten oxide (WO3), is analyzed through ion chromatography (IC).
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