Invention Application
- Patent Title: CONTACT PROBE AND ELECTRICAL CONNECTION JIG
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Application No.: US16466656Application Date: 2017-10-04
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Publication No.: US20190383858A1Publication Date: 2019-12-19
- Inventor: Masami YAMAMOTO , Norihiro OTA , Shigeki SAKAI
- Applicant: NIDEC READ CORPORATION
- Priority: JP2016-244683 20161216
- International Application: PCT/JP2017/036142 WO 20171004
- Main IPC: G01R1/067
- IPC: G01R1/067 ; G01R3/00
Abstract:
A contact probe may include a Ni pipe that may include a coiled spring structure, and the Ni pipe 11 may contain 0.5 to 10 wt % of phosphorus (P). The contact probe may have improved durability, by reducing shrinkage, after probing performed in a high temperature environment.
Public/Granted literature
- US11415599B2 Contact probe and electrical connection jig Public/Granted day:2022-08-16
Information query
