Invention Application
- Patent Title: ABNORMALITY DETECTION DEVICE
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Application No.: US16361208Application Date: 2019-03-22
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Publication No.: US20190294144A1Publication Date: 2019-09-26
- Inventor: Tetsushi TAKAHARA , Yasuhiro NAKAHAMA , Shinji OKUDA , Junichi TAKAMI
- Applicant: FANUC Corporation , RICOH COMPANY, LTD.
- Priority: JP2018-057217 20180323
- Main IPC: G05B19/4065
- IPC: G05B19/4065 ; G01M13/00 ; G05B23/02

Abstract:
Provided is an abnormality detection device with which an abnormality of a machining state of a machine tool can be detected based on information on a section where machining is actually performed in machine tool-based machining. The abnormality detection device detects an abnormality of a machining state of a machine tool machining a workpiece with a tool. The machine tool includes a determination unit determining the machining state by using information related to an actual cutting section in the tool-based machining of the workpiece in the machine tool. The determination unit performs the machining state determination by using a deviation in position and length of a section recognized as the actual cutting section and a physical quantity in the actual cutting section acquired from the machine tool.
Public/Granted literature
- US11048227B2 Abnormality detection device of machine tool Public/Granted day:2021-06-29
Information query
IPC分类: