Provided is a component measuring apparatus configured to determine a functional form that describes wavelength characteristics of a variation attributable to scattering (S (λ)). The apparatus then determines unknown one or more coefficients (p, q) based on a first relational expression that involves a variation attributable to absorption (H (λ1)) and a group of second relational expressions that do not involve variations attributable to absorption (H (λ2a), H (λ2b), H (λ2c)). The apparatus then corrects an absorbance measured at an arbitrary wavelength (λ) using a function where the one or more coefficients (p, q) are applied to the functional form so as to reduce or eliminate at least the effects of scattering of light.