发明申请
- 专利标题: BONDING METHOD
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申请号: US16135689申请日: 2018-09-19
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公开(公告)号: US20190036009A1公开(公告)日: 2019-01-31
- 发明人: Tomoyoshi TAI , Yuji HORI , Keiichiro ASAI , Takashi YOSHINO , Masashi GOTO , Masahiko NAMERIKAWA
- 申请人: NGK INSULATORS, LTD.
- 优先权: JP2016-061710 20160325
- 主分类号: H01L41/313
- IPC分类号: H01L41/313 ; H03H9/145 ; H03H9/02 ; H03H9/25 ; H03H3/08 ; H03H9/05 ; H03H9/17 ; H01L41/187 ; H01L41/337 ; H01L41/39
摘要:
A bonding layer 3 is formed over a piezoelectric material substrate, and the bonding layer 3 is made of or more material selected from the group consisting of silicon nitride, aluminum nitride, alumina, tantalum pentoxide, mullite, niobium pentoxide and titanium oxide. Neutralized beam A is irradiated onto a surface 4 of the bonding layer and a surface of a supporting body to activate the surface of the bonding layer and the surface of the supporting body. The surface of the bonding layer and the surface of the supporting body are bonded by direct bonding.
公开/授权文献
- US10964882B2 Bonding method 公开/授权日:2021-03-30
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