- 专利标题: MAGNETIC PICK AND PLACE PROBE
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申请号: US15770747申请日: 2015-12-21
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公开(公告)号: US20180322993A1公开(公告)日: 2018-11-08
- 发明人: Kyle YAZZIE , Pramod MALATKAR
- 申请人: Intel Corporation
- 国际申请: PCT/US2015/066984 WO 20151221
- 主分类号: H01F7/02
- IPC分类号: H01F7/02 ; B25J15/06 ; G01R1/067
摘要:
A magnetic pick and place probe includes an outer sheath, an inner sheath to vertically slide within the outer sheath, None or more sheath magnets attached to a bottom end of the inner sheath and a tip positioned at a bottom end of the outer sheath to simultaneously pick up an array of magnets for placement on a substrate.
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