Invention Application
- Patent Title: APPARATUS FOR MEASURING ION MOBILITY OF HARMFUL MATERIAL AND REFERENCE DATA OBTAINING METHOD OF THE SAME
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Application No.: US15323317Application Date: 2015-11-26
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Publication No.: US20180275098A1Publication Date: 2018-09-27
- Inventor: Myoung Choul CHOI , Jeong-Hoon KANG , Jung-Hwan KIM
- Applicant: Korea Basic Science Institute
- International Application: PCT/KR2015/012767 WO 20151126
- Main IPC: G01N27/62
- IPC: G01N27/62 ; G01N27/64 ; H01J49/00 ; H01J49/16

Abstract:
Provided are an apparatus for measuring an ionic mobility of a harmful material and a reference data obtaining method thereof. The method includes obtaining a measurement signal by detecting a charge of an ion between electrodes, obtaining a noise signal by insulating the electrodes from the ion, aligning the noise signal with the measurement signal, removing a part of the measurement signal aligned with the noise signal, and calculating reference data from a remaining part of the measurement signal.
Public/Granted literature
- US10209220B2 Apparatus for measuring ion mobility of harmful material and reference data obtaining method of the same Public/Granted day:2019-02-19
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