- 专利标题: WET ETCHING OF SAMARIUM SELENIUM FOR PIEZOELECTRIC PROCESSING
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申请号: US15804394申请日: 2017-11-06
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公开(公告)号: US20180205000A1公开(公告)日: 2018-07-19
- 发明人: Christine Armstrong , Matthew W. Copel , Yu Luo , Paul M. Solomon
- 申请人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 主分类号: H01L41/332
- IPC分类号: H01L41/332 ; H01L41/16 ; H01L41/39
摘要:
A subtractive forming method that includes providing a material stack including a samarium and selenium containing layer and an aluminum containing layer in direct contact with the samarium and selenium containing layer. The samarium component of the samarium and selenium containing layer of the exposed portion of the material stack is etched with an etch chemistry comprising citric acid and hydrogen peroxide that is selective to the aluminum containing layer. The hydrogen peroxide reacts with the aluminum containing layer to provide an oxide etch protectant surface on the aluminum containing layer, and the citric acid etches samarium selectively to the oxide etch protectant surface. Thereafter, a remaining selenium component of is removed by elevating a temperature of the selenium component.
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