Invention Application
- Patent Title: QUALITY DEGRADATION ANALYSIS METHOD, QUALITY DEGRADATION ANALYSIS DEVICE, AND NETWORK SYSTEM
- Patent Title (中): 质量降解分析方法，质量降解分析装置和网络系统
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Application No.: US14933147Application Date: 2015-11-05
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Publication No.: US20160134747A1Publication Date: 2016-05-12
- Inventor: Yuncheng ZHU , Seishi HANAOKA , Hideki OKITA
- Applicant: HITACHI, LTD.
- Applicant Address: JP Tokyo
- Assignee: HITACHI, LTD.
- Current Assignee: HITACHI, LTD.
- Current Assignee Address: JP Tokyo
- Priority: JP2014-226584 20141107
- Main IPC: H04M3/22
- IPC: H04M3/22 ; H04B17/00
Abstract:
A trial number and a failure number of a procedure extending to the plurality of devices configuring the mobile core network are acquired, a process trial number and a failure number of a received message in the single device are acquired, and the possibility of quality degradation of the devices configuring the mobile core network is calculated on the basis of the trial number and the failure numbers.
Public/Granted literature
- US09762727B2 Quality degradation analysis method, quality degradation analysis device, and network system Public/Granted day:2017-09-12
Information query
