发明申请
US20150206581A1 Immunity of Phase Change Material to Disturb in the Amorphous Phase 有权
相变材料在无定形相中干扰的抗扰度

Immunity of Phase Change Material to Disturb in the Amorphous Phase
摘要:
Disturb from the reset to the set state may be reduced by creating an amorphous phase that is substantially free of crystal nuclei when programming the reset state in a phase change memory. In some embodiments, this can be achieved by using a current or a voltage to program that exceeds the threshold voltage of the phase change memory element, but does not exceed a safe current voltage which would cause a disturb.
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