Invention Application
- Patent Title: METHOD FOR FORMING A SEMICONDUCTOR STRUCTURE
- Patent Title (中): 形成半导体结构的方法
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Application No.: US14088445Application Date: 2013-11-25
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Publication No.: US20150147874A1Publication Date: 2015-05-28
- Inventor: Po-Cheng Huang , I-Ming Tseng , Yu-Ting Li , Chun-Hsiung Wang , Wu-Sian Sie , Yi-Liang Liu , Chia-Lin Hsu , Po-Chao Tsao , Chien-Ting Lin , Shih-Fang Tzou
- Applicant: UNITED MICROELECTRONICS CORP.
- Applicant Address: TW Hsin-Chu City
- Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee Address: TW Hsin-Chu City
- Main IPC: H01L21/8234
- IPC: H01L21/8234 ; H01L21/265

Abstract:
The present invention provides a manufacturing method for forming a semiconductor structure, in which first, a substrate is provided, a hard mask is disposed on the substrate, the hard mask is then patterned to form a plurality of fin hard masks and a plurality of dummy fin hard masks, afterwards, a pattern transferring process is performed, to transfer the patterns of the fin hard masks and the fin hard masks into the substrate, so as to form a plurality of fin groups and a plurality of dummy fins. Each dummy fin is disposed on the end side of one fin group, and a fin cut process is performed, to remove each dummy fin.
Public/Granted literature
- US09147612B2 Method for forming a semiconductor structure Public/Granted day:2015-09-29
Information query
IPC分类: