Invention Application
- Patent Title: INPUT STAGE FOR TEMPERATURE MEASUREMENT SYSTEM
- Patent Title (中): 温度测量系统的输入阶段
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Application No.: US13904575Application Date: 2013-05-29
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Publication No.: US20140354308A1Publication Date: 2014-12-04
- Inventor: Merit Hong , David Harnishfeger , Kris Kaufman
- Applicant: INTEL IP CORPORATION
- Main IPC: G01K7/22
- IPC: G01K7/22 ; G01R27/02 ; G01R19/25

Abstract:
A temperature-measurement input stage is disclosed. In accordance with some embodiments of the present disclosure, a temperature-measurement input stage may comprise a resistor, a thermistor, a first multiplexor, an amplifier, a second multiplexor, and an output stage. The first multiplexor may be configured to couple the resistor to a first amplifier input during a first multiplexor state, and couple the thermistor to the first amplifier input during a second multiplexor state. The amplifier may comprise the first amplifier input, a second amplifier input coupled to a voltage reference, and an amplifier output coupled to a feedback path. The second multiplexor may be configured to route a feedback current to the resistor during the first multiplexor state and route the feedback current to the thermistor during the second multiplexor state. The output stage may be configured to provide an output current based on the feedback current.
Public/Granted literature
- US09322719B2 Input stage for temperature measurement system Public/Granted day:2016-04-26
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