发明申请
US20140184380A1 MULTI-STATE MEMORY RESISTOR DEVICE AND METHODS FOR MAKING THEREOF 审中-公开
多状态存储器电阻器件及其制造方法

  • 专利标题: MULTI-STATE MEMORY RESISTOR DEVICE AND METHODS FOR MAKING THEREOF
  • 专利标题(中): 多状态存储器电阻器件及其制造方法
  • 申请号: US13988901
    申请日: 2011-11-25
  • 公开(公告)号: US20140184380A1
    公开(公告)日: 2014-07-03
  • 发明人: Varun AggarwalGaurav Gandhi
  • 申请人: Varun AggarwalGaurav Gandhi
  • 优先权: IN2821/DEL/2010 20101126
  • 国际申请: PCT/IB2011/055304 WO 20111125
  • 主分类号: H01C10/10
  • IPC分类号: H01C10/10
MULTI-STATE MEMORY RESISTOR DEVICE AND METHODS FOR MAKING THEREOF
摘要:
In one aspect, the invention provides a method for making a multi-state memory resistor device. The method comprises providing a convertible component and inducing multiple state-dependent resistances on the convertible component to provide a multi-state memory resistor device. The convertible component is characterized by at least one of packing density, applied pressure, temperature, contact area or combinations thereof. The resistance from the multiple state-dependent resistances of the multi-state memory resistor device is a function of maximum current applied across the convertible component. In another aspect, the invention provides a multi-state memory resistor device comprising a convertible component, wherein the convertible component converts into a multi state memory resistor device having multiple state-dependent resistances when induced with a maximum current across the convertible component.
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