Invention Application
- Patent Title: CHIP ON FILM PACKAGE INCLUDING TEST PADS AND SEMICONDUCTOR DEVICES INCLUDING THE SAME
- Patent Title (中): 芯片封装包括测试垫和包括其中的半导体器件
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Application No.: US13669031Application Date: 2012-11-05
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Publication No.: US20130175528A1Publication Date: 2013-07-11
- Inventor: Sang-Uk Han , Jeong-Kyu Ha , Young-Shin Kwon , Seung-Hwan Kim , Kwan-Jai Lee
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Priority: KR10-2012-0002522 20120109
- Main IPC: H01L23/485
- IPC: H01L23/485

Abstract:
Provided are a chip on film (COF) package and semiconductor having the same. The COF package can include a flexible film having first and second surfaces opposite to and facing each other and including a conductive via penetrating from the first surface to the second surface, first and second conductive patterns respectively is on the first surface and the second surface and electrically connected to each other through the conductive via, an integrated circuit (IC) chip is on the first surface and electrically connected to the first conductive pattern, a test pad overlaps the conductive via and is electrically connected to at least one of the first conductive pattern and the second conductive pattern, and an external connection pattern is on the second surface spaced apart from the conductive via and electrically connected to the second conductive pattern.
Public/Granted literature
- US08853694B2 Chip on film package including test pads and semiconductor devices including the same Public/Granted day:2014-10-07
Information query
IPC分类: