A semiconductor apparatus includes: a plurality of electrical fuses; a rupture unit configured to rupture an electrical fuse in response to rupture information applicable to the plurality of electrical fuses, when a rupture enable signal is activated; a scan unit configured to output information on whether an each of the plurality of electrical fuses are ruptured or not, as scan information, when a scan enable signal is activated; and a shift register unit configured to receive an input signal in synchronization with a clock signal and store the input signal as the rupture information, and configured to receive the scan information and output the scan information as an output signal in synchronization with the clock signal.