Invention Application
- Patent Title: AUTOMATED YIELD MONITORING AND CONTROL
- Patent Title (中): 自动监测和控制
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Application No.: US13428084Application Date: 2012-03-23
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Publication No.: US20120180872A1Publication Date: 2012-07-19
- Inventor: Dennis M. Hilton , Karl Taub , Keith Lipford , Philip A. Zanghi
- Applicant: Dennis M. Hilton , Karl Taub , Keith Lipford , Philip A. Zanghi
- Applicant Address: US MD Columbia
- Assignee: W. R. GRACE & CO.-CONN.
- Current Assignee: W. R. GRACE & CO.-CONN.
- Current Assignee Address: US MD Columbia
- Main IPC: E03B7/07
- IPC: E03B7/07

Abstract:
A system is adapted to automatically maintain a desired yield level for a slurry flow. Measurements of the electrical conductivity of a slurry are taken and corrected for the effects of temperature and pressure. The corrected conductivity measurements are used to arrive at a value for system yield. The system automatically determines if the yield is too high or too low relative to a desired level, and controls the rate at which accelerator is added to the slurry in order to increase or decrease yield.
Public/Granted literature
- US08714177B2 Automated yield monitoring and control Public/Granted day:2014-05-06
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