Invention Application
- Patent Title: ABNORMALITY DETECTION SYSTEM
- Patent Title (中): 异常检测系统
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Application No.: US13189960Application Date: 2011-07-25
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Publication No.: US20110316553A1Publication Date: 2011-12-29
- Inventor: Yuichi Taguchi , Tsuyoshi Koike , Atsushi Yamaguchi
- Applicant: Yuichi Taguchi , Tsuyoshi Koike , Atsushi Yamaguchi
- Applicant Address: JP Kariya-shi
- Assignee: KABUSHIKI KAISHA TOYOTA JIDOSHOKKI
- Current Assignee: KABUSHIKI KAISHA TOYOTA JIDOSHOKKI
- Current Assignee Address: JP Kariya-shi
- Priority: JP2010-168295 20100627
- Main IPC: G01R31/00
- IPC: G01R31/00

Abstract:
The abnormality detection system is provided for detecting an abnormality of an object. The abnormality detection system includes a high-frequency power source, a primary coil, a secondary coil and a controller. The high-frequency power source supplies power. The primary coil receives the power supplied from the high-frequency power source. The secondary coil is mounted to the object in noncontact with the primary coil for receiving power supplied from the primary coil. The controller is operable to detect the power received by the secondary coil and also to determine whether or not an abnormality is present in the object based on the detected power.
Public/Granted literature
- US08896321B2 Abnormality detection system Public/Granted day:2014-11-25
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