Invention Application
- Patent Title: NONVOLATILE MEMORY DEVICE
- Patent Title (中): 非易失性存储器件
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Application No.: US13044865Application Date: 2011-03-10
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Publication No.: US20110303888A1Publication Date: 2011-12-15
- Inventor: Hiroyuki FUKUMIZU , Yasuhiro Nojiri , Tsukasa Nakai , Kazuhiko Yamamoto
- Applicant: Hiroyuki FUKUMIZU , Yasuhiro Nojiri , Tsukasa Nakai , Kazuhiko Yamamoto
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Priority: JP2010-136453 20100615
- Main IPC: H01L45/00
- IPC: H01L45/00

Abstract:
According to one embodiment, a nonvolatile memory device includes a memory cell connected to a first interconnect and a second interconnect. The memory cell includes a plurality of layers. The plurality of layers includes a carbon-containing memory layer sandwiched between a first electrode film and a second electrode film and a carbon-containing barrier layer provided at least one of between the first electrode film and the memory layer and between the second electrode film and the memory layer. The barrier layer has lower electrical resistivity than the memory layer.
Information query
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