发明申请
- 专利标题: AUTOMATIC ANALYZER
- 专利标题(中): 自动分析仪
-
申请号: US12990789申请日: 2009-05-01
-
公开(公告)号: US20110058984A1公开(公告)日: 2011-03-10
- 发明人: Takahiro Sasaki , Yoichi Aruga , Hidetsugu Tanoue
- 申请人: Takahiro Sasaki , Yoichi Aruga , Hidetsugu Tanoue
- 申请人地址: JP Tokyo
- 专利权人: HITACHI HIGH-TECHNOLOGIES CORPORATION
- 当前专利权人: HITACHI HIGH-TECHNOLOGIES CORPORATION
- 当前专利权人地址: JP Tokyo
- 优先权: JP2008-121769 20080508
- 国际申请: PCT/JP2009/058590 WO 20090501
- 主分类号: G01N21/00
- IPC分类号: G01N21/00
摘要:
The automatic analyzer uses a marker that is to be attached to a measurement object. The marker is made of a substance that becomes excited when irradiated. The automatic analyzer has a function of varying irradiation intensity, and controls the intensity of light emitted from an item marker by adjusting the irradiation intensity for each analysis item or for each analysis vessel. Further, the automatic analyzer has a function of controlling the at least one of the position and angle of an analysis vessel during irradiation, and controls the amount of radiation to the measurement object by adjusting at least one of the distance and angle between an irradiation light source and analysis vessel for each analysis item. Furthermore, the automatic analyzer has a function of varying the integration time of photometric means and controls the integration time for each analysis item or for each analysis vessel.
信息查询