发明申请
- 专利标题: Method and apparatus for detecting objects
- 专利标题(中): 用于检测物体的方法和装置
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申请号: US12078737申请日: 2008-04-03
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公开(公告)号: US20100284622A1公开(公告)日: 2010-11-11
- 发明人: Jung-bae Kim , Seong-deok Lee , Jong-ha Lee
- 申请人: Jung-bae Kim , Seong-deok Lee , Jong-ha Lee
- 申请人地址: KR Suwon-si
- 专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人地址: KR Suwon-si
- 优先权: KR10-2007-0120357 20071123
- 主分类号: G06K9/62
- IPC分类号: G06K9/62
摘要:
A method and apparatus for detecting an object are provided. The method calculates a feature value based on features extracted from an input image by using a classifier of an ith stage, compares the calculated feature value with a first threshold value of the ith stage, compares the feature value with a second threshold value of the ith stage according to a result of the comparison between the feature value and the first threshold value of the ith stage, and jumps to a classifier of an i+2th stage according to a result of the comparison between the feature value and the second threshold value of the ith stage. By doing so, the method can avoid repeated calculations and can rapidly detect the object in the input image.
公开/授权文献
- US08666175B2 Method and apparatus for detecting objects 公开/授权日:2014-03-04
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