发明申请
- 专利标题： NON-ORTHOGONAL PARTICLE DETECTION SYSTEMS AND METHODS
- 专利标题（中）： 非正交粒子检测系统和方法
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申请号： US12326335申请日： 2008-12-02
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公开(公告)号： US20090219530A1公开(公告)日： 2009-09-03
- 发明人: John Mitchell , Jon Sandberg , David A. Turner , Dwight A. Sehler
- 申请人： John Mitchell , Jon Sandberg , David A. Turner , Dwight A. Sehler
- 主分类号： G01N15/02
- IPC分类号： G01N15/02 ; G01N21/49
摘要：
Described herein is a particle detection system capable of spatially resolving the interaction of particles with a beam of electromagnetic radiation. Using a specific electromagnetic beam cross sectional shape and orientation, the detection sensitivity of a particle detection system can be improved. Also provided are methods for detecting and sizing particles in a manner that has low background signal and allows for spatially resolving the scattering or emission of electromagnetic radiation from particles.
公开/授权文献
- US07916293B2 Non-orthogonal particle detection systems and methods 公开/授权日：2011-03-29
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