发明申请
US20080052903A1 Method of Forming Aluminum Based Alloy Wiring Circuit and Method of Forming Element Structure of Display Device 审中-公开
铝基合金线路形成方法及显示装置元件结构形成方法

  • 专利标题: Method of Forming Aluminum Based Alloy Wiring Circuit and Method of Forming Element Structure of Display Device
  • 专利标题(中): 铝基合金线路形成方法及显示装置元件结构形成方法
  • 申请号: US11847423
    申请日: 2007-08-30
  • 公开(公告)号: US20080052903A1
    公开(公告)日: 2008-03-06
  • 发明人: Yoshinori MatsuuraTakashi Kubota
  • 申请人: Yoshinori MatsuuraTakashi Kubota
  • 优先权: JPP2006-236826 20060831
  • 主分类号: H05K3/20
  • IPC分类号: H05K3/20 C22C21/00 H01B13/00
Method of Forming Aluminum Based Alloy Wiring Circuit and Method of Forming Element Structure of Display Device
摘要:
The present invention proposes the technique in which aluminum based alloy is used as a wiring material, and the number of process is sharply reduced in the technique of forming the aluminum based alloy wiring circuit, thereby making it possible to efficiently manufacture the element. The present invention is a method of forming the wiring circuit by the aluminum based alloy, wherein the development process of a resist layer and the etching process of an aluminum based alloy film are simultaneously performed with a developing solution for the aluminum based alloy film laminated with the resist layer. This aluminum based alloy is preferably 5 Å/sec to 40 Å/sec in etching rate by the developing solution.
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