发明申请
US20070173037A1 Method of transferring strained semiconductor structures 失效
传输应变半导体结构的方法

  • 专利标题: Method of transferring strained semiconductor structures
  • 专利标题(中): 传输应变半导体结构的方法
  • 申请号: US11641471
    申请日: 2006-12-18
  • 公开(公告)号: US20070173037A1
    公开(公告)日: 2007-07-26
  • 发明人: Michael NastasiLin Shao
  • 申请人: Michael NastasiLin Shao
  • 主分类号: H01L21/322
  • IPC分类号: H01L21/322
Method of transferring strained semiconductor structures
摘要:
The transfer of strained semiconductor layers from one substrate to another substrate involves depositing a multilayer structure on a substrate having surface contaminants. An interface that includes the contaminants is formed in between the deposited layer and the substrate. Hydrogen atoms are introduced into the structure and allowed to diffuse to the interface. Afterward, the deposited multilayer structure is bonded to a second substrate and is separated away at the interface, which results in transferring a multilayer structure from one substrate to the other substrate. The multilayer structure includes at least one strained semiconductor layer and at least one strain-induced seed layer. The strain-induced seed layer can be optionally etched away after the layer transfer.
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