发明申请
- 专利标题: Analog level meter and method of measuring analog signal level
- 专利标题(中): 模拟电平表和测量模拟信号电平的方法
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申请号: US11652553申请日: 2007-01-12
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公开(公告)号: US20070164886A1公开(公告)日: 2007-07-19
- 发明人: Je-Kook Kim , Jun-Ho Huh , Sang-Hoon Moon
- 申请人: Je-Kook Kim , Jun-Ho Huh , Sang-Hoon Moon
- 专利权人: Samsung Electronics Co. Ltd.
- 当前专利权人: Samsung Electronics Co. Ltd.
- 优先权: KR10-2006-0004442 20060116
- 主分类号: H03M1/66
- IPC分类号: H03M1/66
摘要:
An analog level meter and a method of measuring an analog signal level may be provided. The analog level meter may include a comparator, a duty counter, an analog level detector and/or a digital to analog converter (DAC). The comparator may compare a voltage level of the analog signal with a reference voltage and generate an up-down signal. The duty counter may count a duty value of the up-down signal. The analog level detector may output a duty error value obtained by subtracting a target duty value from the duty value of the up-down signal. The analog level meter may output the reference voltage as a measured value of the analog signal when the duty error value is a desired or predetermined value.
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