发明申请
- 专利标题： Transmission electron microscope
- 专利标题（中）： 透射电子显微镜
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申请号： US11356169申请日： 2006-02-17
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公开(公告)号： US20060255273A1公开(公告)日： 2006-11-16
- 发明人: Hiroto Kasai , Takaho Yoshida
- 申请人： Hiroto Kasai , Takaho Yoshida
- 专利权人： Hitachi, Ltd.
- 当前专利权人： Hitachi, Ltd.
- 优先权： JP2005-136803 20050510
- 主分类号： G21K7/00
- IPC分类号： G21K7/00
摘要：
A transmission electron microscope has a means for inputting a spatial size or distance d desired to be observed by the operator, calculates high contrast of an image based on this value and an observing condition which can reduce the influence of a false image superimposed, and desirably modulates an accelerating voltage of the electron microscope based thereon.
公开/授权文献
- US07319225B2 Transmission electron microscope 公开/授权日：2008-01-15
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