Invention Application
- Patent Title: Micro-electromechanical probe circuit substrate
- Patent Title (中): 微机电探头电路基板
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Application No.: US11411125Application Date: 2006-04-26
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Publication No.: US20060244468A1Publication Date: 2006-11-02
- Inventor: Wen-Chang Dong
- Applicant: Wen-Chang Dong
- Priority: TW094206913 20050429
- Main IPC: G01R31/02
- IPC: G01R31/02

Abstract:
A MEMPCS having high stiffness against bending deformation or distortion is formed by integrating the probe, electronic circuit, circuit connecting pad and dielectric material into a complete unit with flexible multiple-layered substrate structure, and the part of the probe extended outside the dielectric material is further wrapped with a protecting layer to form an reinforced structure for increasing high stiffness to the probe and for preventing environmental dirt and particle from getting into the gap existed between the probes of the MEMPCS.
Public/Granted literature
- US07414419B2 Micro-electromechanical probe circuit substrate Public/Granted day:2008-08-19
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