发明申请
US20060177774A1 Process of imaging a photoresist with multiple antireflective coatings
失效
用多个抗反射涂层成像光致抗蚀剂的工艺
- 专利标题: Process of imaging a photoresist with multiple antireflective coatings
- 专利标题(中): 用多个抗反射涂层成像光致抗蚀剂的工艺
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申请号: US11338462申请日: 2006-01-24
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公开(公告)号: US20060177774A1公开(公告)日: 2006-08-10
- 发明人: David Abdallah , Mark Neisser , Ralph Dammel , Georg Pawlowski , John Biafore , Andrew Romano , WooKyu Kim
- 申请人: David Abdallah , Mark Neisser , Ralph Dammel , Georg Pawlowski , John Biafore , Andrew Romano , WooKyu Kim
- 主分类号: G03C5/00
- IPC分类号: G03C5/00
摘要:
A process for imaging a photoresist comprising the steps of, a) forming a stack of multiple layers of organic antireflective coatings on a substrate; b) forming a coating of a photoresist over the upper layer of the stack of multiple layers of organic antireflective coatings; c) imagewise exposing the photoresist with an exposure equipment; and, d) developing the coating with a developer.
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