Invention Application
US20060022217A1 COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR FIELD EFFECT TRANSISTOR STRUCTURE HAVING ION IMPLANT IN ONLY ONE OF THE COMPLEMENTARY DEVICES 有权
补充金属氧化物半导体场效应晶体管结构只有一个完整的器件具有离子植入

  • Patent Title: COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR FIELD EFFECT TRANSISTOR STRUCTURE HAVING ION IMPLANT IN ONLY ONE OF THE COMPLEMENTARY DEVICES
  • Patent Title (中): 补充金属氧化物半导体场效应晶体管结构只有一个完整的器件具有离子植入
  • Application No.: US10903784
    Application Date: 2004-07-30
  • Publication No.: US20060022217A1
    Publication Date: 2006-02-02
  • Inventor: Matthias Passlack
  • Applicant: Matthias Passlack
  • Main IPC: H01L31/0328
  • IPC: H01L31/0328 H01L29/76
COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR FIELD EFFECT TRANSISTOR STRUCTURE HAVING ION IMPLANT IN ONLY ONE OF THE COMPLEMENTARY DEVICES
Abstract:
A complementary metal-oxide-semiconductor field effect transistor structure includes ion implants in only one of the two complementary devices. The transistor structure generally includes a compound semiconductor substrate and an epitaxial layer structure that includes one or more donor layers that establish a conductivity type for the epitaxial layer structure. The ion implants function to “invert” or “reverse” the conductivity type of the epitaxial layer structure in one of the complementary devices. In the example embodiment, p-type acceptor implants are utilized in the p-channel device, while the n-channel device remains implant-free.
Information query
Patent Agency Ranking
0/0