发明申请
- 专利标题: Instrument performance learning apparatus
- 专利标题(中): 仪器性能学习仪器
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申请号: US11183014申请日: 2005-07-15
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公开(公告)号: US20060011046A1公开(公告)日: 2006-01-19
- 发明人: Tsuyoshi Miyaki , Hideyuki Masuda , Kenichi Miyazawa , Mari Yana
- 申请人: Tsuyoshi Miyaki , Hideyuki Masuda , Kenichi Miyazawa , Mari Yana
- 申请人地址: JP Shizuoka-ken
- 专利权人: YAMAHA CORPORATION
- 当前专利权人: YAMAHA CORPORATION
- 当前专利权人地址: JP Shizuoka-ken
- 优先权: JP2004-210714 20040716
- 主分类号: G10H7/00
- IPC分类号: G10H7/00
摘要:
In an instrument performance learning apparatus, a storage section stores model performance waveform data representing a time series of individual performance sounds of a model performance. An input section inputs real performance waveform data representing a time series of individual performance sounds of a real performance. A pitch graph display control section detects each pitch of each individual performance sound from the stored model performance waveform data and from the inputted real performance waveform data, and displays a pitch graph representing transitions of the detected pitches. An amplitude envelope graph display control section detects each amplitude level of each individual performance sound from the model performance waveform data and from the real performance waveform data, and displays an amplitude envelope graph representing transitions of the detected amplitude levels, such that the amplitude envelope graph has a time axis common to that of the pitch graph while the amplitude envelope graph is located in an area of the display device which does not overlap with another area of the display device where the pitch graph is located.
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