Invention Application
- Patent Title: Antenna aligning apparatus for near-field measurement
- Patent Title (中): 用于近场测量的天线对准装置
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Application No.: US11008910Application Date: 2004-12-10
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Publication No.: US20050128137A1Publication Date: 2005-06-16
- Inventor: Jeom-Hun Lee , Jong-Won Eun , Seong-Pal Lee
- Applicant: Jeom-Hun Lee , Jong-Won Eun , Seong-Pal Lee
- Assignee: Electronics and Telecommunications Research Institute
- Current Assignee: Electronics and Telecommunications Research Institute
- Priority: KR2003-90288 20031211
- Main IPC: H01Q3/00
- IPC: H01Q3/00 ; H01Q1/12 ; H01Q25/02 ; G01S7/40

Abstract:
Provided is an antenna aligning apparatus for near-field measurement, which can perform alignment between a measurement target antenna and a probe antenna precisely by using an antenna pattern and detecting coordinates of the least error. The antenna aligning apparatus includes: a receiving antenna, a signal dividing means, a vertical polarization port, a horizontal polarization port, a first amplitude/phase detector, a second amplitude/phase detector, a coordinate determining means for, and a position adjuster.
Public/Granted literature
- US07088287B2 Antenna aligning apparatus for near-field measurement Public/Granted day:2006-08-08
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