Invention Application
- Patent Title: Programmable system for device testing and control
- Patent Title (中): 用于设备测试和控制的可编程系统
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Application No.: US10874969Application Date: 2004-06-23
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Publication No.: US20050107976A1Publication Date: 2005-05-19
- Inventor: Aaron Klijn , Marvin Miller , Francisco Pataro , Michael Willett
- Applicant: Aaron Klijn , Marvin Miller , Francisco Pataro , Michael Willett
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/327 ; G06F19/00

Abstract:
A programmable system for testing relays and controlling systems is provided. In one embodiment the present disclosure provides a programmable device capable of, for example, testing relays. The device includes a signal generator for generating signals to test relays. The device includes a memory location, and a first program stored in the memory location. The first program supports relay testing. The device includes a versioned program to support relay testing, and a processor in communication with the signal generator and the memory location. The device also includes a routine that is operable by the processor to install a versioned program in the memory location replacing the first program.
Public/Granted literature
- US07248986B2 Programmable system for device testing and control Public/Granted day:2007-07-24
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