发明申请
US20050057273A1 Built-in testing apparatus for testing displays and operation method thereof
审中-公开
用于测试显示器的内置测试装置及其操作方法
- 专利标题: Built-in testing apparatus for testing displays and operation method thereof
- 专利标题(中): 用于测试显示器的内置测试装置及其操作方法
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申请号: US10887374申请日: 2004-07-06
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公开(公告)号: US20050057273A1公开(公告)日: 2005-03-17
- 发明人: Hsiao-Yi Lin , Chang-Ming Chao
- 申请人: Hsiao-Yi Lin , Chang-Ming Chao
- 专利权人: Toppoly Optoelectronics Corp.
- 当前专利权人: Toppoly Optoelectronics Corp.
- 优先权: TW92125152 20030912
- 主分类号: G01R31/00
- IPC分类号: G01R31/00 ; G01R31/28 ; G09G3/00 ; G09G3/36
摘要:
A testing apparatus for testing a display and an operation method of the testing apparatus are disclosed. The apparatus is electrically coupled to a driving line of a display, an image signal source and a shorting bar signal source comprises a first bonding pad, n probing terminals and n switch devices. In the present invention, the n probing terminals are electrically coupled to the first bonding pad, where the n is an integer not less than 1. The gate terminal of each switch device is electrically coupled to the shoring bar signal source, the first terminal is electrically coupled to the image signal source and the second terminal is electrically coupled to one of the n probing terminals. In the present invention, the voltage provided by the shorting bar signal source controls serving as a shorting bar test or a full contact test for testing the display.
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