Invention Application
US20040093475A1 Sub-sampling apparatus and method and image sensor employing the same
有权
次采样装置及采用该采样装置的图像传感器
- Patent Title: Sub-sampling apparatus and method and image sensor employing the same
- Patent Title (中): 次采样装置及采用该采样装置的图像传感器
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Application No.: US10659563Application Date: 2003-09-10
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Publication No.: US20040093475A1Publication Date: 2004-05-13
- Inventor: Wan-Hee Jo
- Priority: KR2002-61732 20021010
- Main IPC: G06F009/26
- IPC: G06F009/26
![Sub-sampling apparatus and method and image sensor employing the same](/abs-image/US/2004/05/13/US20040093475A1/abs.jpg.150x150.jpg)
Abstract:
The present disclosure relates to an address sub-sampling apparatus and method, and an image sensor employing the same. An address sub-sampling apparatus includes a counting unit that generates a binary address of N bits, N being a natural number larger than 2. The address sub-sampling apparatus also includes an address conversion unit that sub-samples the binary address of N bits to output a sub-sampled address having first, second and third bit groups, wherein the sub-sampled address is arranged in order of the third, the first and the second bit groups from the MSB (Most Significant Bit). The first bit group, which is a combination of digits in the sub-sampled address corresponding to the number of addresses to be skipped, being set as null0null, the second bit group, which includes the LSB (Least Significant Bit) corresponding to bits of the binary address, and the third bit group, which includes the MSB being set to shift address subtracted by the number of bits in the first bit group from the MSB in the binary address.
Public/Granted literature
- US07394494B2 Sub-sampling apparatus and method and image sensor employing the same Public/Granted day:2008-07-01
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