发明申请
US20030168150A1 Method and constrain layer for reducing shrinkage during sintering low-temperature ceramic 审中-公开
烧结低温陶瓷减少收缩的方法和约束层

  • 专利标题: Method and constrain layer for reducing shrinkage during sintering low-temperature ceramic
  • 专利标题(中): 烧结低温陶瓷减少收缩的方法和约束层
  • 申请号: US10224949
    申请日: 2002-08-20
  • 公开(公告)号: US20030168150A1
    公开(公告)日: 2003-09-11
  • 发明人: Wen-Hsi LeeChe-Yi SuChun-Te LeeJui-Chu Jao
  • 申请人: Phycomp Taiwan Ltd
  • 申请人地址: TW Kaohsiung
  • 专利权人: Phycomp Taiwan Ltd
  • 当前专利权人: Phycomp Taiwan Ltd
  • 当前专利权人地址: TW Kaohsiung
  • 优先权: CN091104260 20020307
  • 主分类号: C03B029/00
  • IPC分类号: C03B029/00
Method and constrain layer for reducing shrinkage during sintering low-temperature ceramic
摘要:
The present invention mainly relates to a method for reducing X-Y shrinkage during sintering low temperature ceramic comprising piling a constrain layer on a dielectric layer on a green ceramic body, which is printed with heterogeneous materials for conductors, resistors, capacitors and the like and/or disposed conductors, resistors, capacitors and the like to reduce shrinkage of the dielectric layer and the green ceramic body. The invention is characterized in that the constrain layer comprises windows in positions complying with the heterogeneous materials and/or conductors, resistors, capacitors and the like printed and/or disposed on the dielectric layer and the green ceramic body to make the heterogeneous materials and/or conductors, resistors, capacitors and the like not being covered when piling the constrain layer and the dielectric layers of the green ceramic body.
公开/授权文献
信息查询
0/0