A semiconductor system includes a controller configured to: select a plurality of fail points based on defect analysis information collected in a process stage, and provide an address designating at least one of the fail points together with a partial reset command; and a semiconductor device including a plurality of functional regions each including one or more of the fail points, the semiconductor device configured to reset, in response to the partial reset command, a sequential circuit disposed in a target functional region corresponding to the address among the functional regions.