Invention Grant
- Patent Title: Semiconductor laser element, testing method, and testing device
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Application No.: US18486776Application Date: 2023-10-13
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Publication No.: US12107393B2Publication Date: 2024-10-01
- Inventor: Kazumasa Nagano , Hiroki Nagai
- Applicant: Nuvoton Technology Corporation Japan
- Applicant Address: JP Kyoto
- Assignee: NUVOTON TECHNOLOGY CORPORATION JAPAN
- Current Assignee: NUVOTON TECHNOLOGY CORPORATION JAPAN
- Current Assignee Address: JP Kyoto
- Agency: Rimon P.C.
- Priority: JP 18141144 2018.07.27
- Main IPC: H01S5/00
- IPC: H01S5/00 ; H01S5/02 ; H01S5/026 ; H01S5/16 ; H01S5/343 ; H01S5/22 ; H01S5/32

Abstract:
A semiconductor laser element that includes a semiconductor layer including a waveguide formed in an intra-layer direction of the semiconductor layer and a window region formed in a front-side end face of the waveguide, has a current-laser optical output characteristic in which, at an operating temperature of 25° C.±3° C., a laser optical output has a maximum value at a first driving current value and the laser optical output is at most 20% of the maximum value at a second driving current value greater than the first driving current value, and is not damaged at the second driving current value.
Public/Granted literature
- US20240055830A1 SEMICONDUCTOR LASER ELEMENT, TESTING METHOD, AND TESTING DEVICE Public/Granted day:2024-02-15
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